Webinar: How to measure the invisible with the most accurate SIOS measurement systems

Sept. 30, 2021, 8:30 a.m. und 03:30 p.m., CET Berlin

Speakers: Dr. Denis Dontsov und Enrico Langlotz

Today’s technological developments follow a common trend in many manufacturing industries: Products are becoming more complex and powerful, the demands on manufacturing quality are constantly increasing, while components and object structures are becoming smaller and more compact.

Webinar: measuring down to the nanometer range with SIOS measurement systems

In turn, the increasing industrial use of micro- and nanotechnological objects leads to ever higher demands on the measurement technology used in manufacturing, verification and positioning. The tasks are realized on objects that are getting larger and larger, so that a link between the macro- and nano-worlds has to be made.

Nanometrology is not only of great interest to the research or semiconductor industry, as a driver of the trend, it has long since found its way into areas such as nanoelectronics, microoptics, genetic engineering, molecular biology, materials research and many more.

In our approximately 45-minute webinar, you will learn how to measure the invisible with the most accurate measurement systems available from SIOS.

Our experts Dr. Denis Dontsov and his colleagues will provide information on the following main topics:

Our speakers will be very happy to answer your questions about nanometrology after the presentation.

REGISTER NOW for the webinar in English on:

Sept. 30, 2021 // 8:30 a.m.

Sept. 30, 2021 // 3:30 p.m.

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