In the beginning of June SIOS again participated in the international conference EUSPEN in Bilbao/Spain. The event took place at the Euskalduna Jauegia Conference Centre. Our managing director Dr. Dontsov was represented with a lecture at the workshop “Industrial in-process manufacturing metrology” led by Prof. Richard Leach, University of Nottingham.
For the exhibition SIOS presented our calibration systems and the differential interferometer SP 5000 DI with extremely high long-term stability. Our sales manager Mr. Grundschok informed in the commercial session about the latest interferometer developments for machine calibration.
The event is characterized by a very high professional level with an increasing number of participants.